Abstract: This paper presents a detailed analysis of the time dynamics of the gate-induced drain leakage (GIDL)-assisted increase of the string potential in vertical-channel 3-D NAND Flash arrays. The ...
; ModuleID = '/Users/wangning/Desktop/cornell_repos/cs6120/project/fusible_results/20251221_141626/fuse08_int_arrays/fuse08_int_arrays.driver.c' source_filename ...
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