Figure 1: a) Charging effect on a non-conductive sample and b) BSD imaging of this sample after 10 nm gold coating. For some applications sputter coating can be used to improve the resolution and ...

During her previous role as Applications Scientist for SEM and AFM products at Keysight Technologies, she acknowledged the extreme importance of proper sample preparation for high-resolution imaging.

Nanomanipulation under scanning electron microscopy (SEM) enables direct interactions of a tool with a sample. We recently developed a nanomanipulation technique for the extraction and ...

Ga FIB-SEM and Xe plasma FIB-SEM both support multiscale investigations. The Ga FIB-SEM’s maximum current is around 100 nA, so it is best suited to material removal or the preparation of cross ...

W ith the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

The key advantage of plasma, as compared to the plasma FIB-SEM, the Gallium, or another source, is that it facilitates the use of the higher current at the beginning, allowing for faster removal of ...

Compared to TEM, SEM offers the advantages of a larger field of view and the ability to analyze thicker samples, simplifying sample preparation. TEM: More than a Passing Activity . TEM involves ...

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Small Skin Sample (for SEM) taken from 1 specimen by Rikke Dahl (Academia Sinica in Taipei) on 12-14 August 2019. Larger ... (Academia Sinica in Taipei) on 12-14 August 2019. Tissue Sample (for DNA ...