CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

KILGORE, Texas (KLTV) - If you remember the days of black and white television, what’s known as the Indian Head test pattern is likely burned into your memory and your old TV set. Believe it or not, ...