Spatial resolution of less than 10 nm has been identified as a requirement for accurate and quantitative two-dimensional dopant profiling by the International Technology Roadmap for Semiconductors ...
Scanning Capacitance Microscopy (SCM) and Scanning Spreading Resistance Microscopy (SSRM) are both well-established scanning probe-based techniques for two-dimensional carrier profiling. Driven by the ...
In an application using a pin-limited microcontroller (MCU), I needed to scan an array of 16 buttons. The technique I used involved a series string of resistors of identical value connected between ...
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