For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...
The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...
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