“The IP package for sale provides a novel probe design with reduced loading effects at all frequency ranges. This portfolio is highly relevant to companies involved in developing and manufacturing ...

Today’s electronic circuit-board technology is posing a big challenge to in-circuit test techniques because of the disappearance of access. As a result, a shift from bed-of-nail to flying-probe ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...

Not knowing how to troubleshoot electrical issues is a death sentence for any DIYer’s bank account. Your only other option is a wild goose chase by throwing money at your car until the problem’s fixed ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

MEASURING live voltages and current in today's high-energy environments can result in a severe hazard to equipment and users if proper precautions are not applied. Given the risk of transients, surges ...