The difference between an anomaly and a defect in product software can be confusing, but it is important to identify which is ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Novade provides apps used to streamline site processes, facilitate collaboration and improve productivity. The Novade mobile app includes the ability to manage inspections, checklists, safety ...