For almost 20 years, researchers and semiconductormanufacturers have been trying to developa practical analog BIST (built-in self-test) formixed-signal ICs. By enabling mixed-signal ICtesting on ...
Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
Staff conducted a survey of stress testing practices among selected national central banks and supervisory authorities. The online survey was undertaken in November 2011 as part of the preparatory ...
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