The market growth is driven by increasing semiconductor testing volumes, advanced node scaling, rising adoption of high-frequency and fine-pitch probes, and expanding OSAT and wafer-level testing ...
If you've ever tenuously probed an expensive IC in a surface-mount package, you'll appreciate these new test adjuncts from Emulation Technology (ET—Santa Clara, Calif.). It's rolling out test clips ...
The CL-QFE44SE-T-01 probing adapter allows probing of a 44-pin, 0.8-mm-pitch IC. The adapter enables probing with a chip in place—it doesn't require unsoldering of the target IC. The QFE44SE-T-01 uses ...
The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...
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