SLE has introduced a scan insertion tool – ScanBlaster is designed to take physical effects into account very early, and to be compatible with many standard test insertion methodologies. The tool can ...
With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...
Mentor Graphics has developed a compression system for scan chain testing of semiconductors that can reduce test data and test time by a factor of ten. Instead of feeding test vectors direct to 16 ...
The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...
In deep sub-micron technology nodes (180nm and lower), the design process of SoC becomes complex by integrating multiple IPs having different functionalities on a single chip. In such a scenario, ...
Design automation is the key to the development of very large ICs. Optimizing the connection and layout of millions of gates to efficiently perform complex functions is not a job to which humans are ...
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