Process Engineer Richard Kasica of NIST’s Center for Nanoscale Science and Technology holds a wafer of the type typically produced in the plasma-enhanced chemical vapor deposition chamber. A new study ...

When a warehouse manager suspects poor system performance, the first step is typically to check the real data. Unfortunately, more than 50% of the time, system performance is measured incorrectly.

There are many ways that measurement can be used in the diagnostic process and in assessing the incidence of diagnostic errors, according to the committee that authored the Institute of Medicine’s ...

All analog measurements — voltage, current, temperature, humidity, etc. — include some amount of error. Your job is to minimize those errors enough to give your ...

A “standard reference thermoelectric module (SRTEM)*” for objectively measuring thermoelectric module performance has been ...

Some bit errors in the output words of an analog-to-digital converter (ADC), such as those due to comparator metastability (sparkle codes) [1] and low-frequency flicker noise, occur over a large ...

Process Engineer Richard Kasica of NIST’s Center for Nanoscale Science and Technology holds a wafer of the type typically produced in the plasma-enhanced chemical vapor deposition chamber. A new study ...