Microprocessors and application-specific integrated circuits (ASICs) require low-voltage, high-current power supplies. These supplies usually have very strict requirements on output-voltage deviations ...
Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...
The Combined Loading Compression (CLC) test method was standardized by ASTM in 2001, as ASTM D6641 1. During the past 10 years it has become the most-used compression test method for composite ...
ADMET has many years of experience in the material testing industry and this has shown the significance of equipping test machines with the exact grips and fixtures. Image Credit: Admet Inc. A machine ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
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