Fujifilm and HORIBA Co-develop High-Sensitivity Inline Raman Measurement System for Real-Time Monitoring of Cell Culture and Purification in Biopharmaceutical Man…

Improves Antibody Yield by About 10% in the Purification ProcessJune 16, 2026 -- FUJIFILM Corporation (President and CEO, ...
EDN

KLA-Tencor Announces Novel Defect Discovery and Monitoring Technology

“Our customers are highly motivated to continue to extend optical inline defect inspection beyond the 20nm node,” said Keith Wells, vice president and general manager of the Wafer Inspection (WIN) ...

Inline Camera Inspection Market worth $3.04 billion by 2032 - Exclusive Report by MarketsandMarkets™

According to MarketsandMarkets™, the Inline Camera Inspection Market is projected to grow from USD 1.78 billion in 2026 to ...
Semiconductor Engineering

Modulated Electron Microscopy Applied In The Process Monitoring Of Memory Cell And The Defect Inspection Of Floating Circuits

A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA ...
Electronic Design

KLA-Tencor launches defect-inspection systems at SEMICON West

San Francisco, CA. KLA-Tencor today announced two new defect-inspection products, addressing key challenges in tool and process monitoring during silicon wafer and chip manufacturing at the ...
Semiconductor Engineering

How Guardbanding Of Inline Wafer Defects Can Improve Chip Reliability Insurance

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...