The applications of spectroscopic ellipsometry for the precise characterization of liquid-liquid and liquid-air interfaces include surface science, biomedical applications, thin film coatings, and ...

Imaging spectroscopic ellipsometry delivers nanometer-level sensitivity and spatial resolution, addressing the limitations of conventional metrology techniques.

Technique exploits the separation of noise and information when measuring the residual error with a cost functions after ...

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric ...

QD-UKI are celebrating 22 years of Spectroscopic Ellipsometry workshops with our partners, J A Woollam. This free of charge workshop is aimed at both experienced ellipsometry users as well as people ...

The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

Recently, a research group led by Prof. Gao Xiaoming and Prof. Liu Kun from Hefei Institutes of Physical Science (HFIPS), Chinese Academy of Sciences (CAS), developed a concentration-independent ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...