Time series analysis forms an essential part of modern data science by examining sequential data to unravel the underlying dynamics of complex systems. In particular, entropy-based measures quantify ...
As integrated circuit (IC) designs have grown in complexity, scale and speed requirements, design rule checking (DRC) has evolved from a routine step into a critical pillar of successful tapeouts.
Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
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