Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...

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SANTA CLARA, Calif., June 23, 2020 /PRNewswire-PRWeb/ -- Park Systems Inc., world-leading manufacturer of Atomic Force Microscopes (AFM) is announcing Park NX-TSH, automated Tip Scan Head for large ...

Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

Cypher is Asylum Research’s high-resolution, small-sample AFM/SPM (atomic force/scanning probe microscope), a system that provides more capability, increased control, and additional modularity to ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Novel developments also focus on quick and high-speed AFM to improve temporal resolution. 2 The combination of AFM with optical microscopy has expanded the number of possible applications, ...

The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

SEOUL, South Korea, Feb. 19, 2025 /PRNewswire/ -- Park Systems, a global leader in atomic force microscopy (AFM), has unveiled an expanded FX Large Sample AFM series at SEMICON Korea 2025. Building on ...

Photothermal AFM-IR, or AFM-IR, is an analytical method used for chemical identification in a materials sample at the nanoscale. AFM-IR incorporates both the nanoscale spatial resolution of atomic ...